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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 6 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
ICCBR
1995
Springer
15 years 6 months ago
Route Planning by Analogy
There have been several e orts to create and use real maps in computer applications that automatically nd good map routes. In general, online map representations do not include in...
Karen Zita Haigh, Manuela M. Veloso
ICS
1995
Tsinghua U.
15 years 6 months ago
A Data Cache with Multiple Caching Strategies Tuned to Different Types of Locality
Current data cache organizations fail to deliver high performance in scalar processors for many vector applications. There are two main reasons for this loss of performance: the u...
Antonio González, Carlos Aliagas, Mateo Val...
SPAA
1995
ACM
15 years 6 months ago
Accounting for Memory Bank Contention and Delay in High-Bandwidth Multiprocessors
For years, the computation rate of processors has been much faster than the access rate of memory banks, and this divergence in speeds has been constantly increasing in recent yea...
Guy E. Blelloch, Phillip B. Gibbons, Yossi Matias,...
TAPSOFT
1995
Springer
15 years 6 months ago
Anatomy of the Pentium Bug
The Pentium computer chip’s division algorithm relies on a table from which five entries were inadvertently omitted, with the result that 1738 single precision dividenddivisor ...
Vaughan R. Pratt
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