8600 search results - page 294 / 1720 » Measuring with Timed Patterns |
142
Voted
TCAD
2008
15 years 3 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
157
Voted
ICDE
2009
IEEE
15 years 1 months ago
2009
IEEE
Search over graph databases has attracted much attention recently due to its usefulness in many fields, such as the analysis of chemical compounds, intrusion detection in network t...
141
Voted
ISORC
2000
IEEE
15 years 8 months ago
2000
IEEE
We describe a real-time, component-based system for an inspection application. We chose the inspection application and the accompanying task (or scenario) so that we might fully e...
130
Voted
INFORMATICALT
2000
15 years 3 months ago
2000
In this work the analytical expressions of half-time T1/2 and its derivatives in respect to distance T1/2/R in a one-dimensional RC medium (a current electrode has a shape of the s...
128
Voted
IUI
2010
ACM
16 years 14 days ago
2010
ACM
In this paper, we present SmartCal, a calendar assistant that suggests appointment attributes, such as time, day, duration, etc., given any combination of initial user input attri...