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163
Voted
BPM
2009
Springer
15 years 10 months ago
2009
Springer
Process mining refers to the extraction of process models from event logs. Real-life processes tend to be less structured and more flexible. Traditional process mining algorithms ...
128
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
N-detect test has been shown to have a higher likelihood for detecting defects. However, traditional definitions of Ndetect test do not necessarily exploit the localized characte...
121
Voted
ICMCS
2008
IEEE
15 years 10 months ago
2008
IEEE
The support of variable block-sizes, though significantly improves the compression efficiency, imposes a big computational challenge on an H.264 encoder. In this paper, we present...
131
Voted
VTS
2008
IEEE
15 years 10 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
157
click to vote
ICC
2007
IEEE
15 years 10 months ago
2007
IEEE
— Network Intrusion Detection Systems (NIDS) are more and more important for identifying and preventing the malicious attacks over the network. This paper proposes a novel cost-e...