8600 search results - page 435 / 1720 » Measuring with Timed Patterns |
120
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ISQED
2002
IEEE
15 years 9 months ago
2002
IEEE
This paper presents a hybrid BIST architecture and methods for optimizing it to test systems-on-chip in a cost effective way. The proposed self-test architecture can be implemente...
145
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IWANN
1999
Springer
15 years 9 months ago
1999
Springer
Recently, a real-time clustering microchip based on the ART1 algorithm has been reported. That chip was able to classify 100-bit input patterns into up to 18 categories. However, i...
ASPDAC
2005
ACM
15 years 6 months ago
2005
ACM
New substrate isolation structures using pattern stacked pn junctions for on-chip inductors in standard CMOS technology are presented. For the first time, through increasing the re...
143
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DKE
2008
15 years 4 months ago
2008
The thematic and citation structures of Data and Knowledge Engineering (DKE) (1985-2007) are identified based on text analysis and citation analysis of the bibliographic records o...
257
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ICDE
2008
IEEE
16 years 6 months ago
2008
IEEE
Finding latent patterns in high dimensional data is an important research problem with numerous applications. Existing approaches can be summarized into 3 categories: feature selec...