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» Measuring with Timed Patterns
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124
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VTS
2008
IEEE
136views Hardware» more  VTS 2008»
15 years 7 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
96
Voted
OSS
2009
Springer
15 years 7 months ago
Heartbeat: Measuring Active User Base and Potential User Interest in FLOSS Projects
This paper presents a novel method and algorithm to measure the size of an open source project’s user base and the level of potential user interest that it generates. Previously ...
Andrea Wiggins, James Howison, Kevin Crowston
120
Voted
ETRA
2010
ACM
160views Biometrics» more  ETRA 2010»
14 years 11 months ago
A vector-based, multidimensional scanpath similarity measure
A great need exists in many fields of eye-tracking research for a robust and general method for scanpath comparisons. Current measures either quantize scanpaths in space (string e...
Halszka Jarodzka, Kenneth Holmqvist, Marcus Nystr&...
111
Voted
AINTEC
2005
Springer
15 years 6 months ago
Multicast Packet Loss Measurement and Analysis over Unidirectional Satellite Network
Packet loss patterns over unidirectional satellite link provide useful information for improving the performance of applications like bulk data transfer to many recipients. In this...
Mohammad Abdul Awal, Kanchana Kanchanasut, Yasuo T...
104
Voted
PAKDD
2009
ACM
170views Data Mining» more  PAKDD 2009»
15 years 10 months ago
Discovering Periodic-Frequent Patterns in Transactional Databases.
Since mining frequent patterns from transactional databases involves an exponential mining space and generates a huge number of patterns, efficient discovery of user-interest-based...
Byeong-Soo Jeong, Chowdhury Farhan Ahmed, Syed Kha...