8600 search results - page 91 / 1720 » Measuring with Timed Patterns |
ITC
2003
IEEE
15 years 3 months ago
2003
IEEE
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
HIS
2003
14 years 11 months ago
2003
Abstract. This paper proposes the fitness control procedure for the application of genetic algorithms (GA) in pattern recognition. Instead of using GA to solve a concomitant optim...
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CVPR
2009
IEEE
16 years 4 months ago
2009
IEEE
Recently a large amount of research has been devoted to
automatic activity analysis. Typically, activities have been
defined by their motion characteristics and represented by
t...
ICIP
1994
IEEE
15 years 11 months ago
1994
IEEE
In this paper, we present a perceptual distortion measure that predicts image integrity far better than mean-squared error. This perceptual distortion measure is based on a model ...
ICPR
2002
IEEE
15 years 11 months ago
2002
IEEE
The analysis of colored surface textures is a challenging research problem in computer vision. Current approaches to this task can be roughly divided into two categories: methods ...