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ICCS
2004
Springer
15 years 11 months ago
Bayer Pattern Demosaicking Using Local-Correlation Approach
A new Bayer pattern demosaicking scheme for single-sensor digital cameras is introduced. The raw output from a sensor, mostly a charge coupled device (CCD) or a complementary metal...
Rastislav Lukac, Konstantinos N. Plataniotis, Anas...
IMR
2004
Springer
15 years 11 months ago
A Generalized Graph-Theoretic Mesh Optimization Model
This paper presents a generic approach to mesh global optimization via node movement, based on a discrete graph-theoretic model. Mesh is considered as an electric system with lump...
Andrey A. Mezentsev
COMPSAC
2003
IEEE
15 years 11 months ago
A Cut-Based Algorithm for Reliability Analysis of Terminal-Pair Network Using OBDD
In this paper, we propose an algorithm to construct the Ordered Binary Decision Diagram (OBDD) representing the cut function of a terminal-pair network. The algorithm recognizes i...
Yung-Ruei Chang, Hung-Yau Lin, Ing-Yi Chen, Sy-Yen...
ICCAD
2003
IEEE
205views Hardware» more  ICCAD 2003»
15 years 11 months ago
Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
Aseem Agarwal, David Blaauw, Vladimir Zolotov
SIGSOFT
2003
ACM
15 years 11 months ago
Evaluating and improving the automatic analysis of implicit invocation systems
Model checking and other finite-state analysis techniques have been very successful when used with hardware systems and less successful with software systems. It is especially di...
Jeremy S. Bradbury, Jürgen Dingel