14 search results - page 1 / 3 » Metric clustering via consistent labeling |
124
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CVPR
2010
IEEE
16 years 1 months ago
2010
IEEE
We consider pixel labeling problems where the label set
forms a tree, and where the observations are also labels.
Such problems arise in feature-space analysis with a very
large...
175
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CVPR
2007
IEEE
16 years 7 months ago
2007
IEEE
A good distance metric is crucial for unsupervised learning from high-dimensional data. To learn a metric without any constraint or class label information, most unsupervised metr...
176
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ICCV
1999
IEEE
16 years 7 months ago
1999
IEEE
In this paper we address the problem of minimizing a large class of energy functions that occur in early vision. The major restriction is that the energy function's smoothnes...
135
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ICPR
2008
IEEE
16 years 1 days ago
2008
IEEE
Structured light systems use projected light to augment a scene with extra information. The goal of such systems is often the recovery of depth information based on 2D image(s) fr...