Sciweavers

689 search results - page 27 / 138
» Metrics for more than two points at once
Sort
View
CGF
2002
156views more  CGF 2002»
14 years 9 months ago
Object Space EWA Surface Splatting: A Hardware Accelerated Approach to High Quality Point Rendering
Elliptical weighted average (EWA) surface splatting is a technique for high quality rendering of point-sampled 3D objects. EWA surface splatting renders water-tight surfaces of co...
Liu Ren, Hanspeter Pfister, Matthias Zwicker
DATE
2008
IEEE
111views Hardware» more  DATE 2008»
15 years 4 months ago
Incremental Criticality and Yield Gradients
— Criticality and yield gradients are two crucial diagnostic metrics obtained from Statistical Static Timing Analysis (SSTA). They provide valuable information to guide timing op...
Jinjun Xiong, Vladimir Zolotov, Chandu Visweswaria...
74
Voted
HT
2003
ACM
15 years 2 months ago
Do adaptation rules improve web cost estimation?
Analogy-based estimation has, over the last 15 years, and particularly over the last 7 years, emerged as a promising approach with comparable accuracy to, or better than, algorith...
Emilia Mendes, Nile Mosley, Steve Counsell
COSIT
2011
Springer
269views GIS» more  COSIT 2011»
13 years 9 months ago
Analyzing the Spatial-Semantic Interaction of Points of Interest in Volunteered Geographic Information
With the increasing success and commercial integration of Volunteered Geographic Information (VGI), the focus shifts away from coverage to data quality and homogeneity. Within the ...
Christoph Mülligann, Krzysztof Janowicz, Mao ...
81
Voted
IPL
2002
65views more  IPL 2002»
14 years 9 months ago
A new bound for map labeling with uniform circle pairs
Given a planar point set, we wish to label the points with uniform circular labels such that each input point lies on the boundary of two labels, none of the interiors of the labe...
Michael J. Spriggs, J. Mark Keil