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VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
15 years 4 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
ICECCS
1999
IEEE
88views Hardware» more  ICECCS 1999»
15 years 4 months ago
UML + ROOM as a Standard ADL?
Designing a software system's architecture properly is one of the most important tasks of any software engineering project. Nevertheless there exists no common definition of ...
Bernhard Rumpe, M. Schoenmakers, Ansgar Radermache...
IPPS
1999
IEEE
15 years 4 months ago
High Speed, High Capacity Bused Interconnects using Optical Slab Waveguides
In this paper we consider the use of optical slab waveguides as buses in a parallel computing environment. We show that slab buses can connect to many more elements than convention...
Martin Feldman, Ramachandran Vaidyanathan, Ahmed E...
WWW
2010
ACM
15 years 6 months ago
Object views: fine-grained sharing in browsers
Browsers do not currently support the secure sharing of JavaScript objects between principals. We present this problem as the need for object views, which are consistent and contr...
Leo A. Meyerovich, Adrienne Porter Felt, Mark S. M...
WCNC
2008
IEEE
15 years 6 months ago
Three-Stage Serially Concatenated Codes and Iterative Center-Shifting K-Best Sphere Detection for SDM-OFDM: An EXIT Chart Aided
—Iterative K-best sphere detection (SD) and channel decoding is appealing, since it is capable of achieving a nearmaximum-a-posteriori (MAP) performance at a low complexity. Howe...
Li Wang, Lei Xu, Sheng Chen, Lajos Hanzo