232 search results - page 21 / 47 » MicroNetwork-Based Integration for SOCs |
DAC
2003
ACM
16 years 22 days ago
2003
ACM
Recent advances in tester technology have led to automatic test equipment (ATE) that can operate at up to several hundred MHz. However, system-on-chip (SOC) scan chains typically ...
DATE
2007
IEEE
15 years 6 months ago
2007
IEEE
Abstract— We present an SoC testing approach that integrates test data compression, TAM/test wrapper design, and test scheduling. An improved LFSR reseeding technique is used as ...
DATE
2008
IEEE
15 years 6 months ago
2008
IEEE
Applications from the embedded consumer domain put challenging requirements on SoC infrastructures, i.e. interconnect and memory. Specifically, video applications demand large sto...
IEEEPACT
2000
IEEE
15 years 4 months ago
2000
IEEE
As on-chip integration matures, single-chip system designers must not only be concerned with component-level issues such as performance and power, but also with onchip system-leve...
DDECS
2007
IEEE
15 years 6 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...