Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. R...
This paper proposes a new method of designing finitesupport wavelet filters, based on minimization of energy in key parts of the frequency domain. In particular this technique is ...