71 search results - page 3 / 15 » Mining IC test data to optimize VLSI testing |
137
Voted
VLSID
1998
IEEE
15 years 7 months ago
1998
IEEE
With several commercial tools becoming available, the high-level synthesis of applicationspeci c integrated circuits is nding wide spread acceptance in VLSI industry today. Existi...
128
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SCANGIS
2003
15 years 4 months ago
2003
The paper describes a tool designed within the first stage of the European project INVISIP in order to explore geographical metadata in the site planning process. A visual data mi...
144
Voted
ICS
1994
Tsinghua U.
15 years 7 months ago
1994
Tsinghua U.
We present a parallel code generation algorithm for complete applications and a new experimental methodology that tests the efficacy of our approach. The algorithm optimizes for d...
124
Voted
IDEAS
2003
IEEE
15 years 8 months ago
2003
IEEE
With the wide development of databases in general and data warehouses in particular, it is important to reduce the tasks that a database administrator must perform manually. The a...
127
Voted
KDD
1997
ACM
15 years 7 months ago
1997
ACM
We address the problem of nding useful regions for two-dimensional association rules and decision trees. In a previous paper we presented ecient algorithms for computing optimiz...