In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
This paper describes a method for robust real time pattern matching. We first introduce a family of image distance measures, the "Image Hamming Distance Family". Members ...
Abstract. Clustering is a widely used unsupervised data analysis technique in machine learning. However, a common requirement amongst many existing clustering methods is that all p...
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
Abstract. This paper investigates symbolic heuristic search with BDDs for solving domain-independent action planning problems cost-optimally. By distributimpact of operators that t...