2 search results - page 1 / 1 » Model Checker Aided Design of a Controller for a Wafer Scann... |
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ISOLA
2004
Springer
15 years 8 months ago
2004
Springer
113
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SPIN
2000
Springer
15 years 6 months ago
2000
Springer
Abstract. We report on the use of model checking techniques for both the verification of a process control program and the derivation of optimal control schedules. Most of this wor...