3031 search results - page 103 / 607 » Model Driven Testing Based on Test History |
97
Voted
ICCD
1997
IEEE
15 years 5 months ago
1997
IEEE
: This paper studies pseudo-random pattern testing of bridging faults. Although bridging faults are generally more random pattern testable than stuck-at faults, examples are shown ...
96
Voted
ICIP
2006
IEEE
15 years 6 months ago
2006
IEEE
During the past years, the development of microarray technology has been remarkable, and it is becoming a daily tool in many genomic research laboratories. The widespread adoption...
104
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GLVLSI
2002
IEEE
15 years 5 months ago
2002
IEEE
Design simplification is becoming necessary to respect the target time-to-market of SoCs, and this goal can be obtained by using predesigned IP-cores. However, their correct inte...
100
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EMSOFT
2008
Springer
15 years 2 months ago
2008
Springer
We investigate the problem of specification based testing with dense sets of inputs and outputs, in particular with imprecision as they might occur due to errors in measurements, ...
107
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SAC
2008
ACM
15 years 5 days ago
2008
ACM
Software-based self-test (SBST) is emerging as a promising technology for enabling at-speed testing of high-speed embedded processors testing in an SoC system. For SBST, test rout...