3031 search results - page 118 / 607 » Model Driven Testing Based on Test History |
115
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IJCAI
2001
15 years 2 months ago
2001
New methods to generate hard random problem instances have driven progress on algorithms for deduction and constraint satisfaction. Recently Achlioptas et al. (AAAI 2000) introduc...
95
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ASPDAC
2004
ACM
15 years 6 months ago
2004
ACM
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
121
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CAISE
2008
Springer
15 years 2 months ago
2008
Springer
Abstract. The European Space Agency (ESA) has created the Simulation Model Portability 2 (SMP2) standard with the purpose to provide a design solution for the project of Spacecraft...
81
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ITC
2003
IEEE
15 years 6 months ago
2003
IEEE
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
122
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SCANGIS
2003
15 years 2 months ago
2003
Recently, along with the breakthrough of the Internet and mobile environment, the development towards screen maps used as intelligent user interfaces appears to be emergent. This m...