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» Model Driven Testing Based on Test History
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120
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ITC
1994
IEEE
90views Hardware» more  ITC 1994»
15 years 7 months ago
Defect Classes - An Overdue Paradigm for CMOS IC
: The IC test industry has struggled .for more than 30years to establish a test approach that would guarantee a low defect level to the customer. Wepropose a comprehensive strategy...
Charles F. Hawkins, Jerry M. Soden, Alan W. Righte...
126
Voted
IWDW
2005
Springer
15 years 9 months ago
ViWiD : Visible Watermarking Based Defense Against Phishing
In this paper, we present a watermarking based approach, and its implementation, for mitigating phishing attacks - a form of web based identity theft. ViWiD is an integrity check m...
Mercan Topkara, Ashish Kamra, Mikhail J. Atallah, ...
DAWAK
2006
Springer
15 years 7 months ago
Priority-Based k-Anonymity Accomplished by Weighted Generalisation Structures
Abstract. Biobanks are gaining in importance by storing large collections of patient's clinical data (e.g. disease history, laboratory parameters, diagnosis, life style) toget...
Konrad Stark, Johann Eder, Kurt Zatloukal
134
Voted
BPM
2009
Springer
143views Business» more  BPM 2009»
15 years 4 months ago
MDPE Workbench - A Solution for Performance Related Decision Support
Abstract. Continuous optimization of business process execution including its adaptation to changes within the market environment or the company itself becomes increasingly importa...
Mathias Fritzsche, Jendrik Johannes, Sebastian Cec...
ISSRE
2002
IEEE
15 years 8 months ago
Inter-Class Mutation Operators for Java
The effectiveness of mutation testing depends heavily on the types of faults that the mutation operators are designed to represent. Therefore, the quality of the mutation operator...
Yu-Seung Ma, Yong Rae Kwon, Jeff Offutt