3031 search results - page 169 / 607 » Model Driven Testing Based on Test History |
164
Voted
VTS
2000
IEEE
15 years 7 months ago
2000
IEEE
Transient Signal Analysis is a digital device testing method that is based on the analysis of voltage transients at multiple test points. In this paper, the power supply transient...
134
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BMCBI
2008
15 years 3 months ago
2008
Background: False discovery rate (FDR) methods play an important role in analyzing highdimensional data. There are two types of FDR, tail area-based FDR and local FDR, as well as ...
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
125
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CORR
1999
Springer
15 years 3 months ago
1999
Springer
We present a technique for automatic induction of slot annotations for subcategorization frames, based on induction of hidden classes in the EM framework of statistical estimation...
190
Voted
BMCBI
2004
15 years 3 months ago
2004
Background: Intrinsic fluctuations due to the stochastic nature of biochemical reactions can have large effects on the response of biochemical networks. This is particularly true ...