3031 search results - page 207 / 607 » Model Driven Testing Based on Test History |
124
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VTS
2005
IEEE
15 years 9 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
127
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ICPR
2000
IEEE
16 years 4 months ago
2000
IEEE
A major challenge for face recognition algorithms lies in the variance faces undergo while changing pose. This problem is typically addressed by building view dependent models bas...
166
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CVPR
2012
IEEE
13 years 6 months ago
2012
IEEE
Simply choosing one model out of a large set of possibilities for a given vision task is a surprisingly difficult problem, especially if there is limited evaluation data with whi...
137
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GLVLSI
2008
IEEE
15 years 4 months ago
2008
IEEE
The main contribution of this work is an analytical model for finding the upper bound on the temperature difference among various locations on the die. The proposed model can be u...
85
Voted
CANDC
2007
ACM
15 years 5 months ago
2007
ACM
Every musician who improvises has a unique musical vocabulary, which may be perceived in his or her compositions. In this paper, we explain our design of a computational model tha...