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» Model Driven Testing Based on Test History
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DAC
2007
ACM
16 years 4 months ago
Characterization and Estimation of Circuit Reliability Degradation under NBTI using On-Line IDDQ Measurement
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
Kunhyuk Kang, Kee-Jong Kim, Ahmad E. Islam, Muhamm...
WSC
2000
15 years 5 months ago
A comparison of five steady-state truncation heuristics for simulation
We compare the performance of five well-known truncation heuristics for mitigating the effects of initialization bias in the output analysis of steady-state simulations. Two of th...
K. Preston White, Michael J. Cobb, Stephen C. Spra...
MOBIWAC
2006
ACM
15 years 10 months ago
Calibration-free WLAN location system based on dynamic mapping of signal strength
In this work we present a calibration-free system for locating wireless local area network devices, based on the radio frequency characteristics of such networks. Calibration proc...
Luís Felipe M. de Moraes, Bruno Astuto A. N...
TASLP
2008
201views more  TASLP 2008»
15 years 3 months ago
Syntactically Lexicalized Phrase-Based SMT
Abstract--Until quite recently, extending Phrase-based Statistical Machine Translation (PBSMT) with syntactic knowledge caused system performance to deteriorate. The most recent su...
Hany Hassan, Khalil Sima'an, Andy Way
TROB
2008
107views more  TROB 2008»
15 years 3 months ago
Templates and Anchors for Antenna-Based Wall Following in Cockroaches and Robots
The interplay between robotics and neuromechanics facilitates discoveries in both fields: nature provides roboticists with design ideas, while robotics research elucidates critical...
J. Lee, S. N. Sponberg, Owen Y. Loh, Andrew G. Lam...