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» Model Driven Testing Based on Test History
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117
Voted
DAC
2011
ACM
14 years 12 days ago
Litmus tests for comparing memory consistency models: how long do they need to be?
Memory consistency litmus tests are small parallel programs that are designed to illustrate subtle differences between memory consistency models by exhibiting different outcomes...
Sela Mador-Haim, Rajeev Alur, Milo M. K. Martin
VTS
1997
IEEE
105views Hardware» more  VTS 1997»
15 years 4 months ago
Critical hazard free test generation for asynchronous circuits
We describe a technique to generate critical hazard-free tests for self-timed control circuits build using a macromodule library, in a partial scan based DFT environment. Wepropos...
Ajay Khoche, Erik Brunvand
95
Voted
CSDA
2010
172views more  CSDA 2010»
15 years 21 days ago
Testing for two components in a switching regression model
We consider switching regression models with independent or Markov-dependent regime. Based on the modified likelihood ratio test (LRT) statistic by Chen, Chen and Kalbfleisch (200...
Jörn Dannemann, Hajo Holzmann
95
Voted
ICST
2009
IEEE
15 years 7 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh
KBSE
2008
IEEE
15 years 7 months ago
Unit Testing of Flash Memory Device Driver through a SAT-Based Model Checker
Flash memory has become virtually indispensable in most mobile devices. In order for mobile devices to successfully provide services to users, it is essential that flash memory b...
Moonzoo Kim, Yunho Kim, Hotae Kim