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» Model Driven Testing Based on Test History
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ICDM
2002
IEEE
133views Data Mining» more  ICDM 2002»
15 years 5 months ago
Estimating the number of segments in time series data using permutation tests
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...
Kari Vasko, Hannu Toivonen
127
Voted
DSRT
2008
IEEE
15 years 2 months ago
Two Complementary Tools for the Formal Testing of Distributed Systems with Time Constraints
The complexity and the variety of the deployed timedependent systems, as well as the high degree of reliability required for their global functioning, justify the care provided to...
Ana R. Cavalli, Edgardo Montes de Oca, Wissam Mall...
94
Voted
AMAST
2006
Springer
15 years 4 months ago
Testing Semantics: Connecting Processes and Process Logics
We propose a methodology based on testing as a framework to capture the interactions of a machine represented in a denotational model and the data it manipulates. Using a duality t...
Dusko Pavlovic, Michael W. Mislove, James Worrell
ECOWS
2008
Springer
15 years 2 months ago
Automatic Timed Test Case Generation for Web Services Composition
In order to specify the composition of Web services, WSBPEL was defined as an orchestrating language by an international standards consortium. In this paper, we propose a method t...
Mounir Lallali, Fatiha Zaïdi, Ana R. Cavalli,...
105
Voted
VTS
1999
IEEE
71views Hardware» more  VTS 1999»
15 years 4 months ago
Test Generation for Ground Bounce in Internal Logic Circuitry
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer