3031 search results - page 93 / 607 » Model Driven Testing Based on Test History |
126
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KBSE
2005
IEEE
15 years 6 months ago
2005
IEEE
In test generation based on model-checking, white-box test criteria are represented as trap conditions written in a temporal logic. A model checker is used to refute trap conditio...
107
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KDD
2006
ACM
16 years 1 months ago
2006
ACM
Outlier detection can uncover malicious behavior in fields like intrusion detection and fraud analysis. Although there has been a significant amount of work in outlier detection, ...
110
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CEC
2009
IEEE
15 years 5 months ago
2009
IEEE
Abstract—A number of population based optimization algorithms have been proposed in recent years to solve unconstrained and constrained single and multi-objective optimization pr...
DAC
2006
ACM
16 years 1 months ago
2006
ACM
The delay fault test pattern set generated by timing unaware commercial ATPG tools mostly affects very short paths, thereby increasing the escape chance of smaller delay defects. ...
111
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BMCBI
2007
15 years 24 days ago
2007
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...