733 search results - page 113 / 147 » Model Reuse through Hardware Design Patterns |
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ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
85
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DAC
2011
ACM
13 years 9 months ago
2011
ACM
In the era of deep sub-wavelength lithography for nanometer VLSI designs, manufacturability and yield issues are critical and need to be addressed during the key physical design i...
MMM
2005
Springer
15 years 3 months ago
2005
Springer
Three-dimensional model acquisition of an object is essential in many multimedia applications. Constructing three-dimensional models of objects from two-dimensional images is an o...
EUROMICRO
2007
IEEE
15 years 4 months ago
2007
IEEE
Code model checking of software components suffers from the well-known problem of state explosion when applied to highly parallel components, despite the fact that a single compon...
ISCAS
2005
IEEE
15 years 3 months ago
2005
IEEE
Abstract — Mapping applications onto different networks-onchip (NoCs) topologies is done by mapping processing cores on local ports of routers considering requirements like laten...