733 search results - page 38 / 147 » Model Reuse through Hardware Design Patterns |
150
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PROLAMAT
1998
15 years 6 months ago
1998
Since design is a process in which designers use various kinds of knowledge and it is an open-ended problem, it is difficult to prepare all necessary knowledge before design. Also...
158
Voted
AOSE
2004
Springer
15 years 10 months ago
2004
Springer
Abstract. The agent-oriented approach has been successfully applied to the solution of complex problems in dynamic open environments. However, to extend its use to mainstream compu...
157
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ICCAD
2009
IEEE
15 years 2 months ago
2009
IEEE
While Dynamic Voltage Scaling (DVS) remains as a popular energy management technique for real-time embedded applications, recent research has identified significant and negative i...
162
Voted
MTDT
2003
IEEE
15 years 10 months ago
2003
IEEE
ct Defect-based testing for digital logic concentrates primarily on methods of test application, including for example at-speed structural tests and IDDQ testing. In contrast, defe...
143
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AHS
2006
IEEE
15 years 8 months ago
2006
IEEE
A new hardware developmental model that shows strong robust transient fault-tolerant abilities and is motivated by embryonic development and a honeycomb structure is presented. Ca...