733 search results - page 73 / 147 » Model Reuse through Hardware Design Patterns |
DATE
2002
IEEE
15 years 2 months ago
2002
IEEE
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
MSWIM
2006
ACM
15 years 3 months ago
2006
ACM
As mobile devices, such as laptops, PDAs or mobile phones, are getting more and more ubiquitous and are able to communicate with each other via wireless technologies, the paradigm...
GECCO
2006
Springer
15 years 1 months ago
2006
Springer
In this paper, a genetic algorithm (GA) is used to design faulttolerant analog controllers for a piezoelectric micro-robot. Firstorder and second-order functions are developed to ...
ISARCS
2010
15 years 1 months ago
2010
Abstract. Software designs equipped with specification of dependability techniques can help engineers to develop critical systems. In this work, we start to envision how a softwar...
ASPDAC
2008
ACM
14 years 11 months ago
2008
ACM
Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges...