We address covariance estimation under mean-squared loss in the Gaussian setting. Specifically, we consider shrinkage methods which are suitable for high dimensional problems wit...
During semiconductor manufacturing, particles undesirably depose on the surface of the wafer causing “open” and “short” defects to interconnects. In this paper, a third ty...
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
Shrikanth Ganapathy, Ramon Canal, Antonio Gonz&aac...
Despite their effectiveness for robust speech processing, missing data techniques are vulnerable to errors in the classification of the input speech signal’s time-frequency poi...
Estimation of time and costs is a crucial factor in an application development project and low error margins are a priority. This principle is also true for development projects f...