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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
15 years 3 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
SDM
2012
SIAM
252views Data Mining» more  SDM 2012»
13 years 2 months ago
Learning from Heterogeneous Sources via Gradient Boosting Consensus
Multiple data sources containing different types of features may be available for a given task. For instance, users’ profiles can be used to build recommendation systems. In a...
Xiaoxiao Shi, Jean-François Paiement, David...
ICDCS
2010
IEEE
15 years 3 months ago
Sentomist: Unveiling Transient Sensor Network Bugs via Symptom Mining
—Wireless Sensor Network (WSN) applications are typically event-driven. While the source codes of these applications may look simple, they are executed with a complicated concurr...
Yangfan Zhou, Xinyu Chen, Michael R. Lyu, Jiangchu...
FTRTFT
1998
Springer
15 years 3 months ago
On the Need for Practical Formal Methods
A controversial issue in the formal methods community is the degree to which mathematical sophistication and theorem proving skills should be needed to apply a formal method. A fun...
Constance L. Heitmeyer
ISSRE
2000
IEEE
15 years 4 months ago
Building Trust into OO Components Using a Genetic Analogy
Despite the growing interest for component-based systems, few works tackle the question of the trust we can bring into a component. This paper presents a method and a tool for bui...
Benoit Baudry, Vu Le Hanh, Jean-Marc Jéz&ea...