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VLSID
2002
IEEE
97views VLSI» more  VLSID 2002»
16 years 27 days ago
Multiple Faults: Modeling, Simulation and Test
We give an algorithm to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most ? ? ? modeling gates, when the multiplicity...
Yong Chang Kim, Vishwani D. Agrawal, Kewal K. Salu...
ICASSP
2011
IEEE
14 years 4 months ago
Dirichlet Mixture Models of neural net posteriors for HMM-based speech recognition
In this paper, we present a novel technique for modeling the posterior probability estimates obtained from a neural network directly in the HMM framework using the Dirichlet Mixtu...
Balakrishnan Varadarajan, Garimella S. V. S. Sivar...
87
Voted
ICST
2008
IEEE
15 years 7 months ago
On Combining Multi-formalism Knowledge to Select Models for Model Transformation Testing
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
Sagar Sen, Benoit Baudry, Jean-Marie Mottu
NAACL
2003
15 years 1 months ago
A Generative Probabilistic OCR Model for NLP Applications
In this paper, we introduce a generative probabilistic optical character recognition (OCR) model that describes an end-to-end process in the noisy channel framework, progressing f...
Okan Kolak, William J. Byrne, Philip Resnik
107
Voted
ECCV
2008
Springer
16 years 2 months ago
A Generative Shape Regularization Model for Robust Face Alignment
In this paper, we present a robust face alignment system that is capable of dealing with exaggerating expressions, large occlusions, and a wide variety of image noises. The robustn...
Leon Gu, Takeo Kanade