1890 search results - page 43 / 378 » Model-Based Testing in Practice |
TCAD
2008
14 years 11 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
PTS
2007
15 years 1 months ago
2007
Black-box testing is a popular technique for assessing the quality of a system. However, in case of a test failure, only little information is available to identify the root-cause ...
AGILEDC
2005
IEEE
15 years 5 months ago
2005
IEEE
Most significant software processes involve a wide range of disciplines, from programming to testing, and from documentation to database development. Unfortunately, agile processe...
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KDD
2000
ACM
15 years 3 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
KDD
2007
ACM
16 years 7 days ago
2007
ACM
The web provides an unprecedented opportunity to evaluate ideas quickly using controlled experiments, also called randomized experiments (single-factor or factorial designs), A/B ...