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VTS
1997
IEEE
133views Hardware» more  VTS 1997»
15 years 4 months ago
ATPG for scan chain latches and flip-flops
A new approach for testing the bistable elements (latches and flip-flops) in scan chain circuits is presented. In this approach, we generate test patterns that apply a checking ex...
Samy Makar, Edward J. McCluskey
DEXAW
2008
IEEE
124views Database» more  DEXAW 2008»
15 years 1 months ago
Weighting Influence of User Behavior in Software Validation
Validation is an essential part of software development, and testing is a practical and widely used approach. The emerging methodology is model-based testing, in which test cases ...
Antonia Bertolino, Emanuela G. Cartaxo, Patr&iacut...
ISSTA
2006
ACM
15 years 5 months ago
Coverage metrics for requirements-based testing
In black-box testing, one is interested in creating a suite of tests from requirements that adequately exercise the behavior of a software system without regard to the internal st...
Michael W. Whalen, Ajitha Rajan, Mats Per Erik Hei...
QSIC
2005
IEEE
15 years 5 months ago
Software Testing Education and Training in Hong Kong
While the use of computer applications is widely spread in every business and, hence, the reliability of software is critical, it is believed that many organizations involved in s...
F. T. Chan, W. H. Tang, T. Y. Chen
VTS
2003
IEEE
115views Hardware» more  VTS 2003»
15 years 5 months ago
Fault Testing for Reversible Circuits
Irreversible computation necessarily results in energy dissipation due to information loss. While small in comparison to the power consumption of today’s VLSI circuits, if curre...
Ketan N. Patel, John P. Hayes, Igor L. Markov