We propose a new framework for black-box conformance testing of real-time systems, where specifications are modeled as nondeterministic and partially-observable timed automata. We...
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
Often the most expensive and time-consuming task in building a pattern recognition system is col lecting and accurately labeling training and testing data. In this paper, we exp...
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...