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SPIN
2004
Springer
15 years 5 months ago
Black-Box Conformance Testing for Real-Time Systems
We propose a new framework for black-box conformance testing of real-time systems, where specifications are modeled as nondeterministic and partially-observable timed automata. We...
Moez Krichen, Stavros Tripakis
ITC
2003
IEEE
146views Hardware» more  ITC 2003»
15 years 5 months ago
A New Approach for Low Power Scan Testing
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing has become a critical problem. In our studies on practical LSI manufacturing, we ha...
Takaki Yoshida, Masafumi Watari
HASE
2007
IEEE
15 years 3 months ago
Model Validation using Automatically Generated Requirements-Based Tests
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
Ajitha Rajan, Michael W. Whalen, Mats Per Erik Hei...
IJCAI
2003
15 years 1 months ago
Evaluating Classifiers by Means of Test Data with Noisy Labels
Often the most expensive and time-consuming task in building a pattern recognition system is col­ lecting and accurately labeling training and testing data. In this paper, we exp...
Chuck P. Lam, David G. Stork
DAC
2000
ACM
16 years 25 days ago
System chip test: how will it impact your design?
A major challenge in realizing core-based system chips is the adoption and design-in of adequate test and diagnosis strategies. This tutorial paper discusses the specific challeng...
Yervant Zorian, Erik Jan Marinissen