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ESEM
2009
ACM
15 years 6 months ago
Usability testing with total-effort metrics
Usability testing activities have numerous benefits in theory, yet they are often overlooked or disregarded in practice. A testing paradigm which yields objective, quantitative re...
Liam Feldman, Carl J. Mueller, Dan E. Tamir, Oleg ...
ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
15 years 5 months ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
ATS
2003
IEEE
126views Hardware» more  ATS 2003»
15 years 5 months ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 3 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
ISPW
2006
IEEE
15 years 5 months ago
Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development
Abstract. Zorro is a system designed to automatically determine whether a developer is complying with the Test-Driven Development (TDD) process. Automated recognition of TDD could ...
Hongbing Kou, Philip M. Johnson