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ESEM
2009
ACM
16 years 20 days ago
Usability testing with total-effort metrics
Usability testing activities have numerous benefits in theory, yet they are often overlooked or disregarded in practice. A testing paradigm which yields objective, quantitative re...
Liam Feldman, Carl J. Mueller, Dan E. Tamir, Oleg ...
ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
15 years 11 months ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
ATS
2003
IEEE
126views Hardware» more  ATS 2003»
15 years 11 months ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor
DATE
2004
IEEE
131views Hardware» more  DATE 2004»
15 years 10 months ago
Efficient Modular Testing of SOCs Using Dual-Speed TAM Architectures
The increasing complexity of system-on-chip (SOC) integrated circuits has spurred the development of versatile automatic test equipment (ATE) that can simultaneously drive differe...
Anuja Sehgal, Krishnendu Chakrabarty
ISPW
2006
IEEE
16 years 4 days ago
Automated Recognition of Low-Level Process: A Pilot Validation Study of Zorro for Test-Driven Development
Abstract. Zorro is a system designed to automatically determine whether a developer is complying with the Test-Driven Development (TDD) process. Automated recognition of TDD could ...
Hongbing Kou, Philip M. Johnson