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SCOPES
2007
Springer
15 years 6 months ago
2007
Springer
SCOPES
2007
Springer
15 years 6 months ago
2007
Springer
RTCSA
2005
IEEE
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2005
IEEE
SAMOS
2004
Springer
15 years 5 months ago
2004
Springer
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2004
IEEE
15 years 3 months ago
2004
IEEE
As technology scales, transient faults have emerged as a key challenge for reliable embedded system design. This paper proposes a design methodology that incorporates reliability i...