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ICCAD
2006
IEEE
99views Hardware» more  ICCAD 2006»
16 years 1 months ago
Variability and yield improvement: rules, models, and characterization
Yield and variability are becoming detractors for successful design in sub-90-nm process technologies. We consider the fundamental lithography and process issues that are driving ...
Kenneth L. Shepard, Daniel N. Maynard
337
Voted
EGPGV
2011
Springer
330views Visualization» more  EGPGV 2011»
14 years 8 months ago
Real-Time Ray Tracer for Visualizing Massive Models on a Cluster
We present a state of the art read-only distributed shared memory (DSM) ray tracer capable of fully utilizing modern cluster hardware to render massive out-of-core polygonal model...
Thiago Ize, Carson Brownlee, Charles D. Hansen
JMLR
2010
157views more  JMLR 2010»
14 years 11 months ago
Combining Experiments to Discover Linear Cyclic Models with Latent Variables
We present an algorithm to infer causal relations between a set of measured variables on the basis of experiments on these variables. The algorithm assumes that the causal relatio...
Frederick Eberhardt, Patrik O. Hoyer, Richard Sche...
MASCOTS
2008
15 years 6 months ago
Optimal Layered Multicast with Network Coding: Mathematical Model and Empirical Studies
Abstract--Recent advances in network coding research dramatically changed the underlying structure of optimal multicast routing algorithms and made them efficiently computable. Whi...
Ajay Gopinathan, Zongpeng Li
ATAL
2007
Springer
15 years 10 months ago
Embedding Landmarks and Scenes in a Computational Model of Institutions
Over the last decade, institutions have demonstrated that they are a powerful mechanism to make agent interactions more effective, structured, coordinated and efficient. Different...
Owen Cliffe, Marina De Vos, Julian A. Padget