7557 search results - page 1305 / 1512 » Modeling Timed Concurrent Systems |
165
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DATE
2006
IEEE
16 years 1 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
161
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WCRE
2006
IEEE
16 years 1 months ago
2006
IEEE
Research on maintenance task structure modeling has so far examined only how often program artifacts are modified, and what information can be deduced from modification records....
177
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ICCAD
2005
IEEE
16 years 18 days ago
2005
IEEE
— Balanced truncation (BT) model order reduction (MOR) is known for its superior accuracy and computable error bounds. Balanced stochastic truncation (BST) is a particular BT pro...
175
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APN
2005
Springer
16 years 16 days ago
2005
Springer
This paper describes the verification module (the VipVerify Module) of the VipTool [4]. VipVerify allows to verify whether a given scenario is an execution of a system model, give...
204
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PKDD
2005
Springer
16 years 14 days ago
2005
Springer
Location-awareness and prediction of future locations is an important problem in pervasive and mobile computing. In cellular systems (e.g., GSM) the serving cell is easily availabl...