72 search results - page 12 / 15 » Modeling Tool Failures in Semiconductor Fab Simulation |
AADEBUG
1997
Springer
15 years 1 months ago
1997
Springer
Currently, few tools are available for assisting developers with debugging intelligent systems. Because these systems rely heavily on context dependent knowledge and sometimes sto...
DATE
2009
IEEE
15 years 4 months ago
2009
IEEE
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
DATE
2005
IEEE
15 years 3 months ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
77
Voted
ISLPED
2006
ACM
15 years 3 months ago
2006
ACM
Process variations will increasingly impact the operational characteristics of integrated circuits in nanoscale semiconductor technologies. Researchers have proposed various desig...
101
Voted
TVLSI
2010
14 years 4 months ago
2010
Abstract-- The operational characteristics of integrated circuits based on nanoscale semiconductor technology are expected to be increasingly affected by variations in the manufact...