72 search results - page 13 / 15 » Modeling Tool Failures in Semiconductor Fab Simulation |
108
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DT
2006
14 years 9 months ago
2006
The widely used engineering decisions concerning the performance of technological equipment for process industries are usually deterministic. Since the early 1990s probabilistic m...
ISLPED
2009
ACM
15 years 4 months ago
2009
ACM
The theoretical lower limit of subthreshold swing in MOSFETs (60 mV/decade) significantly restricts low voltage operation since it results in a low ON to OFF current ratio at low ...
AGENTS
2000
Springer
15 years 1 months ago
2000
Springer
Abstract. One of the reasons for attending to agent technology is the evergrowing complexity of information systems and the increasing difficulty to foresee and plan for all potent...
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FTCS
1998
14 years 11 months ago
1998
Most fault-tolerant systems are designed to stop faulty programs before they write permanent data or communicate with other processes. This property (halt-on-failure) forms the co...
EWC
2007
14 years 9 months ago
2007
This paper describes and exercises a new design paradigm for cast components. The methodology integrates foundry process simulation, non-destructive evaluation (nde), stress analys...