72 search results - page 8 / 15 » Modeling Tool Failures in Semiconductor Fab Simulation |
WSC
2007
14 years 12 months ago
2007
Fluctuations of work-in-progress (WIP) levels cause variability of cycle time and often lead to productivity losses in semiconductor wafer fabrication plants. To identify sources ...
ISQED
2005
IEEE
15 years 3 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
DAC
2008
ACM
15 years 10 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
RSP
2003
IEEE
15 years 2 months ago
2003
IEEE
With advances in semiconductor technology, processors are becoming larger and more complex. Future processor designers will face an enormous design space, and must evaluate more a...
WSC
1998
14 years 11 months ago
1998
Continuous or high-speed manufacturing equipment is an integral part of the food and beverage, pharmaceutical, and consumer products industries. For many years, these industries h...