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IWANN
1995
Springer
15 years 1 months ago
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
SIAMSC
2011
140views more  SIAMSC 2011»
14 years 17 days ago
A Fast Parallel Algorithm for Selected Inversion of Structured Sparse Matrices with Application to 2D Electronic Structure Calcu
Abstract. An efficient parallel algorithm is presented and tested for computing selected components of H−1 where H has the structure of a Hamiltonian matrix of two-dimensional la...
Lin Lin, Chao Yang, Jianfeng Lu, Lexing Ying, Wein...
ICDAR
2007
IEEE
15 years 4 months ago
Multi-Objective Optimization for SVM Model Selection
In this paper, we propose a multi-objective optimization method for SVM model selection using the well known NSGA-II algorithm. FA and FR rates are the two criteria used to find ...
Clément Chatelain, Sébastien Adam, Y...
BMCBI
2008
123views more  BMCBI 2008»
14 years 9 months ago
Pol II promoter prediction using characteristic 4-mer motifs: a machine learning approach
Background: Eukaryotic promoter prediction using computational analysis techniques is one of the most difficult jobs in computational genomics that is essential for constructing a...
Firoz Anwar, Syed Murtuza Baker, Taskeed Jabid, Md...
WWW
2009
ACM
15 years 4 months ago
Reliability analysis using weighted combinational models for web-based software
In the past, some researches suggested that engineers can use combined software reliability growth models (SRGMs) to obtain more accurate reliability prediction during testing. In...
Chao-Jung Hsu, Chin-Yu Huang