105 search results - page 21 / 21 » Modeling and Simulation |
133
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ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
107
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ICCAD
2007
IEEE
15 years 10 months ago
2007
IEEE
— Starting at the 65nm node, stress engineering to improve performance of transistors has been a major industry focus. An intrinsic stress source – shallow trench isolation –...
ICCAD
2006
IEEE
15 years 10 months ago
2006
IEEE
Statistical static timing analysis (SSTA) is emerging as a solution for predicting the timing characteristics of digital circuits under process variability. For computing the stat...
ICCAD
2005
IEEE
15 years 10 months ago
2005
IEEE
Abstract— We present in this paper a new interconnect-driven multilevel floorplanning, called IMF, to handle large-scale building-module designs. Unlike the traditional multilev...
135
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ICCAD
1997
IEEE
15 years 5 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...