105 search results - page 2 / 21 » Modeling and Simulation |
100
click to vote
ICCAD
2006
IEEE
15 years 10 months ago
2006
IEEE
We describe a transition fault model, which is easy to simulate under test sequences that are applied at-speed, and provides a target for the generation of at-speed test sequences...
119
click to vote
ICCAD
2001
IEEE
15 years 10 months ago
2001
IEEE
—In this paper, we present an approach to nonlinear model reduction based on representing a nonlinear system with a piecewise-linear system and then reducing each of the pieces w...
ICCAD
2001
IEEE
15 years 10 months ago
2001
IEEE
This paper presents both compact analytical models and fast SPICE based 3-D electro-thermal simulation methodology to characterize thermal effects due to Joule heating in high per...
127
click to vote
ICCAD
1999
IEEE
15 years 5 months ago
1999
IEEE
Constraining and input biasing are frequently used techniques in functional verification methodologies based on randomized simulation generation. Constraints confine the simulatio...
ICCAD
2003
IEEE
15 years 10 months ago
2003
IEEE