We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Virtualization is often used in cloud computing platforms for its several advantages in efficiently managing resources. However, virtualization raises certain additional challeng...
Aman Kansal, Feng Zhao, Jie Liu, Nupur Kothari, Ar...
Reverse engineering is concerned with the reconstruction of surfaces from three-dimensional point clouds originating from laser-scanned objects. We present an adaptive surface rec...
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...