30 search results - page 4 / 6 » Modeling the Effect of Technology Trends on the Soft Error R... |
MICRO
2008
IEEE
14 years 20 days ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
SIGMETRICS
2011
ACM
12 years 9 months ago
2011
ACM
The amount of charge stored in an SRAM cell shrinks rapidly with each technology generation thus increasingly exposing caches to soft errors. Benchmarking the FIT rate of caches d...
ICCD
2006
IEEE
14 years 3 months ago
2006
IEEE
— As silicon CMOS devices are scaled down into the nanoscale regime, new challenges at both the device and system level are arising. While some of these challenges will be overco...
DATE
2007
IEEE
14 years 18 days ago
2007
IEEE
Device scaling in new and future technologies brings along severe increase in the soft error rate of circuits, for combinational and sequential logic. Although potential solutions...
ISCA
2008
IEEE
14 years 20 days ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...