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ISBI
2006
IEEE
15 years 10 months ago
Joint texture and topography estimation for extended depth of field in brightfield microscopy
Brightfield microscopy often suffers from limited depth of field, which prevents thick specimens from being imaged entirely in-focus. By optically sectioning the specimen, the inf...
François Aguet, Dimitri Van De Ville, Micha...
ICSEA
2007
IEEE
15 years 4 months ago
A Novel Framework for Test Domain Reduction using Extended Finite State Machine
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
Nutchakorn Ngamsaowaros, Peraphon Sophatsathit
IJCNN
2007
IEEE
15 years 4 months ago
On Extending the SMO Algorithm Sub-Problem
—The Support Vector Machine is a widely employed machine learning model due to its repeatedly demonstrated superior generalization performance. The Sequential Minimal Optimizatio...
Christopher Sentelle, Michael Georgiopoulos, Georg...
IEEECIT
2006
IEEE
15 years 3 months ago
Extending Pervasive Devices with the Semantic Grid: A Service Infrastructure Approach
Pervasive computing devices are gradually becoming increasingly prevalent in our everyday life, enabling the users in the physical world to interact with the digital world. Grid c...
Tao Guan, Ed Zaluska, David De Roure
ATAL
2005
Springer
15 years 3 months ago
Multiagent coordination by Extended Markov Tracking
We present here Extended Markov Tracking (EMT), a computationally tractable method for the online estimation of Markovian system dynamics, along with experimental support for its ...
Zinovi Rabinovich, Jeffrey S. Rosenschein