723 search results - page 65 / 145 » Modelling Lexical Stress |
ENVSOFT
2007
15 years 4 months ago
2007
The Plant Protection Product Directive (91/414/EEC) stresses the need of validated models to calculate predicted environmental concentrations. The use of models has become an unav...
115
click to vote
HICSS
1998
IEEE
15 years 8 months ago
1998
IEEE
The design and implementation of a conceptual model, CAFE (a Categorization Assistant For E-mail), is described. The model supports the organization, searching, and retrieval of i...
157
click to vote
DAC
2006
ACM
15 years 10 months ago
2006
ACM
Negative bias temperature instability (NBTI) has become the dominant reliability concern for nanoscale PMOS transistors. In this paper, a predictive model is developed for the deg...
145
click to vote
ISQED
2011
IEEE
14 years 8 months ago
2011
IEEE
With continuous scaling of transistors in each technology generation, NBTI and Process Variation (PV) have become very important silicon reliability problems for the microprocesso...
117
click to vote
ICCAD
2006
IEEE
16 years 1 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, th...