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DATE
2007
IEEE
155views Hardware» more  DATE 2007»
15 years 5 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
DATE
2007
IEEE
110views Hardware» more  DATE 2007»
15 years 5 months ago
Nonlinearity analysis of Analog/RF circuits using combined multisine and volterra analysis
Abstract— Modern integrated radio systems require highly linear analog/RF circuits. Two-tone simulations are commonly used to study a circuit’s nonlinear behavior. Very often, ...
Jonathan Borremans, Ludwig De Locht, Piet Wambacq,...
DSN
2007
IEEE
15 years 5 months ago
Robustness Testing of the Windows DDK
Modern computers interact with many kinds of external devices, which have lead to a state where device drivers (DD) account for a substantial part of the operating system (OS) cod...
Manuel Mendonça, Nuno Neves
ICCCN
2007
IEEE
15 years 5 months ago
On Short Forward Error-Correcting Codes for Wireless Communication Systems
—For real-time wireless communications, short forward error-correcting (FEC) codes are indispensable due to the strict delay requirement. In this paper we study the performance o...
Sheng Tong, Dengsheng Lin, Aleksandar Kavcic, Baom...
ICDCSW
2007
IEEE
15 years 5 months ago
Event Stream Processing with Out-of-Order Data Arrival
Complex event processing has become increasingly important in modern applications, ranging from supply chain management for RFID tracking to real-time intrusion detection. The goa...
Ming Li, Mo Liu, Luping Ding, Elke A. Rundensteine...