367 search results - page 4 / 74 » Multi-Core Design Automation Challenges |
DAC
2001
ACM
16 years 21 days ago
2001
ACM
We highlight several fundamental challenges to designing highperformance integrated circuits in nanometer-scale technologies (i.e. drawn feature sizes < 100 nm). Dynamic power ...
DAC
2005
ACM
15 years 1 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...
ICCAD
2005
IEEE
15 years 8 months ago
2005
IEEE
Abstract— Physics offers several active devices with nanometerscale footprint, which can be best used in combination with a CMOS subsystem. Such hybrid circuits offer the potenti...
DAC
2000
ACM
16 years 21 days ago
2000
ACM
The use of deep submicron process technologies presents several new challenges in the area of manufacturing test. While a significant body of work has been devoted to identifying ...
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ASPDAC
2012
ACM
13 years 7 months ago
2012
ACM
Behavioral synthesis tools have made significant progress in compiling high-level programs into register-transfer level (RTL) specifications. But manually rewriting code is still ...