382 search results - page 56 / 77 » Multi-objective pattern and feature selection by a genetic a... |
EVOW
2008
Springer
14 years 11 months ago
2008
Springer
Automatic Defect Classification (ADC) is a well-developed technology for inspection and measurement of defects on patterned wafers in the semiconductors industry. The poor training...
CIBCB
2008
IEEE
15 years 4 months ago
2008
IEEE
— The genetic causes of many monogenic diseases have already been discovered. However, most common diseases are actually the result of complex nonlinear interactions between mult...
ASPDAC
2006
ACM
15 years 3 months ago
2006
ACM
This paper advances a new methodology based on signal-path information to resolve the problem of device-level placement for analog layout. This methodology is mainly based on three...
GECCO
2010
Springer
15 years 1 months ago
2010
Springer
Shaping functions can be used in multi-task reinforcement learning (RL) to incorporate knowledge from previously experienced tasks to speed up learning on a new task. So far, rese...
ICES
2000
Springer
15 years 1 months ago
2000
Springer
Testing is a key issue in the design and production of digital circuits: the adoption of BIST (Built-In Self-Test) techniques is increasingly popular, but requires efficient algori...